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公開日期標題作者
1-五月-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2011A Novel Array-Based Test Methodology for Local Process Variation MonitoringLuo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009A novel array-based test methodology for local process variation monitoringLuo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael S. -Y.; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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