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公開日期標題作者
1-四月-2010Comprehensive Noise Characterization and Modeling for 65-nm MOSFETs for Millimeter-Wave ApplicationsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2011Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2012Investigation of Temperature-Dependent High-Frequency Noise Characteristics for Deep-Submicrometer Bulk and SOI MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2007On the RF extrinsic resistance extraction for partially-depleted SOI MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2009Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal-Oxide-Semiconductor Field-Effect TransistorsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006RF extrinsic resistance extraction considering neutral-body effect for partially-depleted SOI MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2008Temperature dependence of high frequency noise behaviors for RF MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Lin, Chien-Ting; Liang, Victor; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Temperature Dependences of RF Small-Signal Characteristics for the SOI Dynamic Threshold Voltage MOSFETWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2010Temperature-Dependent RF Small-Signal and Noise Characteristics of SOI Dynamic Threshold Voltage MOSFETsWang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Liao, Kuo-Hsiang; Chen, Bo-Yuan; Huang, Sheng-Yi; Hung, Cheng-Chou; Huang, Guo-Wei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010先進金氧半場效電晶體考慮溫度相依之高頻小訊號及雜訊特性分析王生圳; Wang, Sheng-Chun; 蘇彬; Su, Pin; 電子研究所