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Browsing by Author Wong, H. -S. Philip

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Showing results 1 to 9 of 9
Issue DateTitleAuthor(s)
28-Aug-2017AC stress and electronic effects on SET switching of HfO2 RRAMLiu, Jen-Chieh; Magyari-Kope, Blanka; Qin, Shengjun; Zheng, Xin; Wong, H. -S. Philip; Hou, Tuo-Hung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Design and Optimization Methodology for 3D RRAM ArraysDeng, Yexin; Chen, Hong-Yu; Gao, Bin; Yu, Shimeng; Wu, Shih-Chieh; Zhao, Liang; Chen, Bing; Jiang, Zizhen; Liu, Xiaoyan; Hou, Tuo-Hung; Nishi, Yoshio; Kang, Jinfeng; Wong, H. -S. Philip; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Aug-2020Design Space Analysis for Cross-Point 1S1MTJ MRAM: Selector-MTJ CooptimizationChiang, Hung-Li; Chen, Tzu-Chiang; Song, Ming-Yuan; Chen, Yu-Sheng; Chiu, Jung-Piao; Chiang, Katherine; Manfrini, Mauricio; Cai, Jin; Gallagher, William J.; Wang, Tahui; Diaz, Carlos H.; Wong, H. -S. Philip; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
7-Jun-2014Multi-level control of conductive nano-filament evolution in HfO2 ReRAM by pulse-train operationsZhao, L.; Chen, H. -Y.; Wu, S. -C.; Jiang, Z.; Yu, S.; Hou, T. -H.; Wong, H. -S. Philip; Nishi, Y.; 電機工程學系; Department of Electrical and Computer Engineering
1-Dec-2017Resistive random access memory (RRAM) technology: From material, device, selector, 3D integration to bottom-up fabricationChen, Hong-Yu; Brivio, Stefano; Chang, Che-Chia; Frascaroli, Jacopo; Hou, Tuo-Hung; Hudec, Boris; Liu, Ming; Lv, Hangbing; Molas, Gabriel; Sohn, Joon; Spiga, Sabina; Teja, V. Mani; Vianello, Elisa; Wong, H. -S. Philip; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2009Selective Device Structure Scaling and Parasitics Engineering: A Way to Extend the Technology RoadmapWei, Lan; Deng, Jie; Chang, Li-Wen; Kim, Keunwoo; Chuang, Ching-Te; Wong, H. -S. Philip; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2017Statistical Study of RRAM MLC SET Variability Induced by Filament MorphologyHsu, Chung-Wei; Zheng, Xin; Wu, Yi; Hou, Tuo-Hung; Wong, H. -S. Philip; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Mar-2020Wafer-scale single-crystal hexagonal boron nitride monolayers on Cu (111)Chen, Tse-An; Chuu, Chih-Piao; Tseng, Chien-Chih; Wen, Chao-Kai; Wong, H. -S. Philip; Pan, Shuangyuan; Li, Rongtan; Chao, Tzu-Ang; Chueh, Wei-Chen; Zhang, Yanfeng; Fu, Qiang; Yakobson, Boris I.; Chang, Wen-Hao; Li, Lain-Jong; 交大名義發表; 電子物理學系; National Chiao Tung University; Department of Electrophysics
1-Jan-1970Wafer-scale single-crystal hexagonal boron nitride monolayers on Cu (111)Chen, Tse-An; Chuu, Chih-Piao; Tseng, Chien-Chih; Wen, Chao-Kai; Wong, H. -S. Philip; Pan, Shuangyuan; Li, Rongtan; Chao, Tzu-Ang; Chueh, Wei-Chen; Zhang, Yanfeng; Fu, Qiang; Yakobson, Boris I.; Chang, Wen-Hao; Li, Lain-Jong; 交大名義發表; 電子物理學系; National Chiao Tung University; Department of Electrophysics
Showing results 1 to 9 of 9