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公開日期標題作者
1-十二月-2017Analysis of the Gate Capacitance-Voltage Characteristics in p-GaN/AlGaN/GaN HeterostructuresWu, Tian-Li; Bakeroot, Benoit; Liang, Hu; Posthuma, Niels; You, Shuzhen; Ronchi, Nicolo; Stoffels, Steve; Marcon, Denis; Decoutere, Stefaan; 國際半導體學院; International College of Semiconductor Technology
1-一月-2017Bias- and Temperature-Assisted Trapping/De-trapping of R-ON Degradation in D-mode AlGaN/GaN MIS-HEMTs on a Si substrateZhang, Jin-Ming; Hsieh, Ting-En; Wu, Tian-Li; Chen, Szu-Hao; Chen, Shi-Xuan; Chou, Po-Chien; Chang, Edward Yi; 機械工程學系; 材料科學與工程學系; 電子工程學系及電子研究所; 國際半導體學院; Department of Mechanical Engineering; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
2011Characteristics of 4H-SiC RF MOSFETs on a Semi-insulating SubstrateWu, Tian-Li; Huang, Chih-Fang; Cheng, Chun-Hu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Demonstration of Annealing-free Metal-Insulator-Semiconductor (MIS) Ohmic Contacts on a GaN Substrate using Low Work-function Metal Ytterbium (Yb) and Al2O3 Interfacial LayerWu, Tian-Li; Tseng, Yang-Yan; Huang, Chih-Fang; Chen, Zih-Sin; Lin, Chih-Chien; Chung, Chung-Jen; Huang, Po-Kai; Kao, Kuo-Hsing; 國際半導體學院; International College of Semiconductor Technology
1-九月-2020Design and analysis of high electron mobility transistor inspired: III-V electro-optic modulator topologiesDas, Pallabi; Wu, Tian-Li; Tallur, Siddharth; 交大名義發表; National Chiao Tung University
1-三月-2019Effects of Annealing on Ferroelectric Hafnium-Zirconium-Oxide-Based Transistor TechnologyChen, Yi-Hsuan; Su, Chun-Jung; Hu, Chenming; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-一月-1970Effects of gamma-Ray Irradiation on AlGaN/GaN Heterostructures and High Electron Mobility Transistor DevicesSharma, Chandan; Singh, Rajendra; Chao, Der-Sheng; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-十二月-2019Gamma-Ray Irradiation Effect on Ferroelectric Devices with Hafnium Aluminum OxidesLiu, Chien; Tung, Yi-Chun; Wu, Tian-Li; Cheng, Chun-Hu; Tseng, Chih-Yang; Chen, Hsuan-Han; Chen, Hsi-Han; Ma, Jun; Lin, Chien-Liang; Zheng, Zhi-Wei; Chou, Wu-Ching; Hsu, Hsiao-Hsuan; 光電系統研究所; 電子物理學系; 國際半導體學院; Institute of Photonic System; Department of Electrophysics; International College of Semiconductor Technology
1-四月-2020Impact of the polarization on time-dependent dielectric breakdown in ferroelectric Hf0.5Zr0.5O2 on Ge substratesYang, Ting-Hsin; Su, Chun-Jung; Wang, Yu-Shun; Kao, Kuo-Hsing; Lee, Yao-Jen; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-四月-2020Improved TDDB Reliability and Interface States in 5-nm Hf0.5Zr0.5O2 Ferroelectric Technologies Using NH3 Plasma and Microwave AnnealingChen, Yi-Hsuan; Su, Chun-Jung; Yang, Ting-Hsin; Hu, Chenming; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-一月-2018Investigation of Degradation Phenomena in GaN-on-Si Power MIS-HEMTs under Source Current and Drain Bias StressesYang, Chih-Yi; Wu, Tian-Li; Hsieh, Tin-En; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; 國際半導體學院; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-二月-2020Investigation of Recessed Gate AlGaN/GaN MIS-HEMTs with Double AlGaN Barrier Designs toward an Enhancement-Mode CharacteristicWu, Tian-Li; Tang, Shun-Wei; Jiang, Hong-Jia; 國際半導體學院; International College of Semiconductor Technology
1-九月-2019Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative gamma-ray irradiationSharma, Chandan; Modolo, Nicola; Chen, Hsi-Han; Tseng, Yang-Yan; Tang, Shun-Wei; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Singh, Rajendra; Wu, Tian-Li; 國際半導體學院; International College of Semiconductor Technology
1-三月-2020Numerical Study of 4H-SiC UMOSFETs with Split-Gate and P plus ShieldingJiang, Jheng-Yi; Wu, Tian-Li; Zhao, Feng; Huang, Chih-Fang; 國際半導體學院; International College of Semiconductor Technology
1-四月-2020Study on the effects of Si implantation on the interface of 4H-SiC lateral MOSFETsJiang, Jheng-Yi; Hung, Jia-Qing; Huang, Pin-Wei; Wu, Tian-Li; Huang, Chi-Fang; 交大名義發表; National Chiao Tung University
1-三月-2020Understanding gamma-Ray Induced Instability in AlGaN/GaN HEMTs Using a Physics-Based Compact ModelSharma, Chandan; Modolo, Nicola; Wu, Tian-Li; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Visvkarma, Ajay Kumar; Vinayak, Seema; Singh, Rajendra; 國際半導體學院; International College of Semiconductor Technology