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顯示 1 到 13 筆資料，總共 13 筆
公開日期標題作者
2012Alternate Hammering Test for Application-Specific DRAMs and an Industrial Case StudyHuang, Rei-Fu; Yang, Hao-Yu; Chao, Mango C. -T.; Lin, Shih-Chin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2011Detecting Stability Faults in Sub-threshold SRAMsLin, Chen-Wei; Yang, Hao-Yu; Huang, Chin-Yuan; Chen, Hung-Hsin; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Chao, Mango C-T; Huang, Rei-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2013Fault Models and Test Methods for Subthreshold SRAMsLin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Huang, Chin-Yuan; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2009Fault Models for Embedded-DRAM MacrosChao, Mango C. -T.; Yang, Hao-Yu; Huang, Rei-Fu; Lin, Shih-Chin; Chin, Ching-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2017Predicting Vt Variation and Static IR Drop of Ring Oscillators Using Model-Fitting TechniquesHuang, Tzu-Hsuan; Hung, Wei-Tse; Yang, Hao-Yu; Chang, Wen-Hsiang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015Random Pattern Generation for Post-Silicon Validation of DDR3 SDRAMYang, Hao-Yu; Kuo, Shih-Hua; Huang, Tzu-Hsuan; Chen, Chi-Hung; Lin, Chris; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2012Testing Methodology of Embedded DRAMsYang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2014Testing Methods for a Write-Assist Disturbance-Free Dual-Port SRAMYang, Hao-Yu; Lin, Chen-Wei; Huang, Chao-Ying; Lu, Ching-Ho; Lai, Chen-An; Chao, Mango C. -T.; Huang, Rei-Fu; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2010Testing Methods for Detecting Stuck-open Power Switches in Coarse-Grain MTCMOS DesignsMu, Szu-Pang; Wang, Yi-Ming; Yang, Hao-Yu; Chao, Mango C. -T.; Chen, Shi-Hao; Tseng, Chih-Mou; Tsai, Tsung-Ying; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015Testing Methods for Quaternary Content Addressable Memory Using Charge-Sharing Sensing SchemeYang, Hao-Yu; Huang, Rei-Fu; Su, Chin-Lung; Lin, Kuan-Hong; Shu, Hang-Kaung; Peng, Chi-Wei; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Testing Strategies for a 9T Sub-threshold SRAMYang, Hao-Yu; Lin, Chen-Wei; Chen, Hung-Hsin; Chao, Mango C. -T.; Tu, Ming-Hsien; Jou, Shyh-Jye; Chuang, Ching-Te; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014前瞻性嵌入式記憶體之錯誤模型與測試方法：業界實例探討楊皓宇; Yang, Hao-Yu; 趙家佐; Chao, Chia-Tso; 電子工程學系 電子研究所
顯示 1 到 13 筆資料，總共 13 筆