| 公開日期 | 標題 | 作者 |
| 2009 | Flicker Noise in Nanoscale pMOSFETs with Mobility Enhancement Engineering and Dynamic Body Biases | Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十一月-2010 | The Impact of Layout-Dependent STI Stress and Effective Width on Low-Frequency Noise and High-Frequency Performance in Nanoscale nMOSFETs | Yeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2010 | The Impact of MOSFET Layout Dependent Stress on High Frequency Characteristics and Flicker Noise | Yeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-2010 | The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal-Oxide-Semiconductor Field Effect Transistors under Dynamic Body Biases | Yeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2011 | The Impact of Uniaxial Strain on Flicker Noise and Random Telegraph Noise of SiC Strained nMOSFETs in 40nm CMOS Technology | Yeh, Kuo-Liang; Chang, Chih-Shiang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2010 | The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/Drain | Yeh, Kuo-Liang; Hong, Wei-Lun; Guo, Jyh-Chyum; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2010 | The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/Drain | Yeh, Kuo-Liang; Hong, Wei-Lun; Guo, Jyh-Chyurn; 交大名義發表; National Chiao Tung University |
| 十一月-2016 | Invalidation of Atorvastatin Patent Highlights Complex Chinese Patent Law | Chen, Feng-Chi; Yeh, Kuo-Liang; 生物科技學系; Department of Biological Science and Technology |
| 1-九月-2011 | Layout-Dependent Stress Effect on High-Frequency Characteristics and Flicker Noise in Multifinger and Donut MOSFETs | Yeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2009 | Low Frequency Noise in Nanoscale pMOSFETs with Strain Induced Mobility Enhancement and Dynamic Body Biases | Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2013 | Narrow-Width Effect on High-Frequency Performance and RF Noise of Sub-40-nm Multifinger nMOSFETs and pMOSFETs | Yeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2018 | A New Compact Model for Accurate Simulation of RF Noise in Sub-40nm Multi-finger nMOSFETs | Guo, Jyh-Chyurn; Yeh, Kuo-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-2011 | A New Method for Layout-Dependent Parasitic Capacitance Analysis and Effective Mobility Extraction in Nanoscale Multifinger MOSFETs | Yeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2016 | 奈米Si CMOS元件模型與參數萃取方法應用於包含佈局與應力工程效應之高頻模擬與雜訊分析 | 葉國良; 郭治群; Yeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系 電子研究所 |
| 2005 | 專利訴訟之定暫時狀態處分救濟 | 葉國良; Yeh, Kuo-Liang; 劉尚志; Dr. Shang-Jyh Liu; 科技法律研究所 |
