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公開日期標題作者
2009Flicker Noise in Nanoscale pMOSFETs with Mobility Enhancement Engineering and Dynamic Body BiasesYeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2010The Impact of Layout-Dependent STI Stress and Effective Width on Low-Frequency Noise and High-Frequency Performance in Nanoscale nMOSFETsYeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010The Impact of MOSFET Layout Dependent Stress on High Frequency Characteristics and Flicker NoiseYeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2010The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal-Oxide-Semiconductor Field Effect Transistors under Dynamic Body BiasesYeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2011The Impact of Uniaxial Strain on Flicker Noise and Random Telegraph Noise of SiC Strained nMOSFETs in 40nm CMOS TechnologyYeh, Kuo-Liang; Chang, Chih-Shiang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2010The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/DrainYeh, Kuo-Liang; Hong, Wei-Lun; Guo, Jyh-Chyum; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/DrainYeh, Kuo-Liang; Hong, Wei-Lun; Guo, Jyh-Chyurn; 交大名義發表; National Chiao Tung University
十一月-2016Invalidation of Atorvastatin Patent Highlights Complex Chinese Patent LawChen, Feng-Chi; Yeh, Kuo-Liang; 生物科技學系; Department of Biological Science and Technology
1-九月-2011Layout-Dependent Stress Effect on High-Frequency Characteristics and Flicker Noise in Multifinger and Donut MOSFETsYeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009Low Frequency Noise in Nanoscale pMOSFETs with Strain Induced Mobility Enhancement and Dynamic Body BiasesYeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2013Narrow-Width Effect on High-Frequency Performance and RF Noise of Sub-40-nm Multifinger nMOSFETs and pMOSFETsYeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2018A New Compact Model for Accurate Simulation of RF Noise in Sub-40nm Multi-finger nMOSFETsGuo, Jyh-Chyurn; Yeh, Kuo-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2011A New Method for Layout-Dependent Parasitic Capacitance Analysis and Effective Mobility Extraction in Nanoscale Multifinger MOSFETsYeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2016奈米Si CMOS元件模型與參數萃取方法應用於包含佈局與應力工程效應之高頻模擬與雜訊分析葉國良; 郭治群; Yeh, Kuo-Liang; Guo, Jyh-Chyurn; 電子工程學系 電子研究所
2005專利訴訟之定暫時狀態處分救濟葉國良; Yeh, Kuo-Liang; 劉尚志; Dr. Shang-Jyh Liu; 科技法律研究所
顯示 1 到 15 筆資料，總共 15 筆