瀏覽 的方式: 作者 Zhang, Yu-Xin

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公開日期標題作者
1-四月-2019The Effect of Microwave Annealing of Reliability Characteristics on Amorphous IGZO Thin Film TransistorsWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Cheng, Chia-Yao; 電子工程學系及電子研究所; 國際半導體學院; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-七月-2020Effects of P-Type SnOx Thin-Film Transistors with N-2 and O-2 Ambient Furnace AnnealingZhang, Yu-Xin; Wu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Xu, Ni; Tsai, Kai-Chien; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
2016The Investigation for In-Ga-Zn-O TFTs with Post Deposition of in-situ Ar/H-2 Plasma Treatment by Atmospheric Pressure Plasma JetChang, Kow-Ming; Huang, Bo-Wen; Wu, Chien-Hung; Chen, Hsin-Ying; Zheng, You-Xian; Lee, Ming-Chuan; Zhang, Yu-Xin; Lin, Chuang-Ju; Cheng, Yu-Hsuan; Wang, Shui-Jinn; Hsu, Jui-Mei; Lin, Yu-Li; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2019Investigation of Electrical Characteristics on AP-PECVD Fabricated Amorphous IGZO TFTs with Hydrogen Plasma TreatmentWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Tan, Yu-Hsuan; 電子工程學系及電子研究所; 國際半導體學院; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-四月-2019Investigation of Electrical Characteristics on LaAlO3/ZrO2/IGZO TFTs with Microwave AnnealingWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Cheng, Chia-Yao; 電子工程學系及電子研究所; 國際半導體學院; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-三月-2018Investigation of Gate-Stacked In-Ga-Zn-O TFTs with Ga-Zn-O Source/Drain Electrodes by Atmospheric Pressure Plasma-Enhanced Chemical Vapor DepositionWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Huang, Bo-Wen; Zhang, Yu-Xin; Wang, Shui-Jinn; Hsu, Jui-Mei; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2020Investigation of Microwave Annealing on Resistive Random Access Memory Device with Atmospheric Pressure Plasma Enhanced Chemical Vapor Deposition Deposited IGZO LayerWu, Chien-Hung; Kuo, Song-Nian; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Xu, Ni; Liu, Wu-Yang; Chin, Albert; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
1-七月-2020Reliability of Atmosphere Pressure-Plasma Enhanced Chemical Vapor Deposition Deposited Indium Gallium Zinc Oxide Resistive Random Access Memory Device with Microwave AnnealingWu, Chien-Hung; Kuo, Song-Nian; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Xu, Ni; Liu, Wu-Yang; Chin, Albert; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
1-七月-2020Study of Atmospheric-Pressure Plasma Enhanced Chemical Vapor Deposition Fabricated Indium Gallium Zinc Oxide Thin Film Transistors with In-Situ Hydrogen Plasma TreatmentChen, Yi-Ming; Wu, Chien-Hung; Chang, Kow-Ming; Zhang, Yu-Xin; Xu, Ni; Yu, Tsung-Ying; Chin, Albert; 電機學院; 電子工程學系及電子研究所; College of Electrical and Computer Engineering; Department of Electronics Engineering and Institute of Electronics
1-四月-2019Study of In-Situ Hydrogen Plasma Treatment on InGaZnO with Atmospheric Pressure-Plasma Enhanced Chemical Vapor DepositionWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Tan, Yu-Hsuan; 電子工程學系及電子研究所; 國際半導體學院; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology
1-三月-2018Using KrF ELA to Improve Gate-Stacked LaAlO3/ZrO2 Indium Gallium Zinc Oxide Thin-Film Transistors with Novel Atmospheric Pressure Plasma-Enhanced Chemical Vapor Deposition TechniqueWu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Huang, Bo-Wen; Zhang, Yu-Xin; Wang, Shui-Jinn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics