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收集所有交通大學研究人員與學生個人或團體所發表之各項學術著作，涵蓋期刊論文、教師專書、學位論文等項。;;Collections of Publications of NCTU Researchers and Students Like Journal Papers and Thesis.

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有機金屬氣相磊晶法成長砷化銦鎵與砷化銦量子點特性研究
(2001)
李威儀
;
LEE WEI-I
;
國立交通大學電子物理學系
砷化銦/砷化鋁銦應力補償之高速電晶體
(1999)
蔡中
;
交通大學電子工程系
Improvement on the noise performance of InAs-based HEMTs with gate sinking technology
(2010-11-01)
Hsu, Heng-Tung
;
Kuo, Chien-I
;
Chang, Edward Y.
;
Kuo, Fang-Yao
;
材料科學與工程學系
Improvement on the RF and noise performance for 80 nm InAs/In(0.7)Ga(0.3)As high-electron mobility transistor (HEMT) through gate sinking technology is presented. After gate sinking at 250 degrees C for 3 min, the device exhibited a high transconductance of 1900 mS/mm at a drain bias of 0.5 V with 1066 mA/mm drain-source saturation current. A current-gain cutoff frequency (f(T)) of 113 GHz and a maximum oscillation frequency (f(max)) of 110 GHz were achieved at extremely low drain bias of 0.1 V. The 0.08 x 40 mu m(2) device with gate sinking demonstrated 0.82 dB minimum noise figure and 14 dB associated gain at 17 GHz with only 1.14 mW DC power consumption. Significant improvement in RF and noise performance was mainly attributed to the reduction of gate-to-channel distance together with the parasitic source resistance through gate sinking technology. (C) 2010 Elsevier B.V. All rights reserved.
Ion beam studies of InAs/GaAs quantum dots after annealing
(2008-04-01)
Niu, H.
;
Chen, C. H.
;
Wang, H. Y.
;
Wu, S. C.
;
Lee, C. P.
The microstructure changes of self-assembled InAs/GaAs quantum dots during RTA treatment was investigated using ion channeling and photoluminescence (PL). A small blueshift of the PL emission is observed for annealing temperatures of 650-800 degrees C and an obvious blueshift at 850 degrees C. The yield of channeled spectra decreased as annealing temperature was increased, but the yield increased while temperature above 800 degrees C in RTA. These results imply the strain of QD varied during RTA treatments. In addition, the As/Ga atomic ratio near the surface was determined from the surface peaks of the channeled spectrum. (c) 2008 Elsevier B.V. All rights reserved.
Investigation of Characteristics of Al2O3/n-In (x) Ga1-x As (x=0.53, 0.7, and 1) Metal-Oxide-Semiconductor Structures
(2013-08-01)
Trinh, Hai-Dang
;
Lin, Yueh-Chin
;
Kuo, Chien-I
;
Chang, Edward Yi
;
Hong-Quan Nguyen
The electrical properties of Al2O3/n-InGaAs metal-oxide-semiconductor capacitors (MOSCAPs) with In content of 0.53, 0.7, and 1 (InAs) have been investigated. Results show small capacitance-voltage (C-V) frequency dispersion in accumulation (1.70% to 1.85% per decade) for these MOSCAPs, mostly being assigned to border traps in Al2O3. With higher In content, shorter minority-carrier response time and smaller C-V hysteresis are observed. The reduction of C-V hysteresis might be related to the reduction of Ga-bearing oxides in Al2O3/InGaAs interfaces as indicated by x-ray photoelectron spectroscopy.
Improving the photoluminescence properties of self-assembled InAs surface quantum dots by incorporation of antimony
(2011-08-15)
Chiang, C. H.
;
Wu, Y. H.
;
Hsieh, M. C.
;
Yang, C. H.
;
Wang, J. F.
This study investigates the effects of surfactant and segregation from InAs surface quantum dots (SQDs) by incorporating antimony (Sb) into the QD layers. The Sb surfactant effect extends planar growth and suppresses dot formation. Incorporating Sb can reduce the density of SQDs by more than two orders of magnitude. Photoluminescence (PL) reveals enhancement in the optical properties of InAs SQDs as the Sb beam equivalent pressure (BEP) increases. This improvement is caused by the segregation of Sb on the surface of SQDs, which reduces non-radiative recombination and suppresses carrier loss. The dark line at the SQDs surface in the transmission electron microscopic image suggests that the incorporated Sb probably segregates close to the surface of the SQDs. These results indicate a marked Sb segregation effect that can be exploited to improve the surface-sensitive properties of SQDs for biological sensing. Crown Copyright (C) 2011 Published by Elsevier B. V. All rights reserved.
Ion-channeling studies of InAs/GaAs quantum dots
(2005-12-01)
Niu, H
;
Chen, CH
;
Wang, HY
;
Wu, SC
;
Lee, CP
Determination of the strains in and around the quantum dots is important both to assess the results of the epitaxially grown thin film and to explain the optical performance of quantum dots samples. A series of InAs/GaAs quantum dots samples were fabricated by MBE in Stranski-Krastanov growth mode. The preliminary results of ion-channeling observations along < 001 > growth direction and < 011 > direction will be presented and discussed briefly. (c) 2005 Elsevier B.V. All rights reserved.
RF and logic performance improvement of In0.7Ga0.3As/InAs/In0.7Ga0.3As composite-channel HEMT using gate-sinking technology
(2008-04-01)
Kuo, Chien-I
;
Hsu, Heng-Tung
;
Chang, Edward Yi
;
Chang, Chia-Yuan
;
Miyamoto, Yasuyuki
Eighty-nanometer-gate In0.7Ga0.3As/InAs/ In0.7Ga0.3As composite-channel high-electron mobility transistors (HEMTs), which are fabricated using platinum buried gate as the Schottky contact metal, were evaluated for RF and logic application. After gate sinking at 250 degrees C for 3 min, the device exhibited a high g(m) value of 1590 mS/mm at V-d = 0.5 V, the current-gain cutoff frequency f(T) was increased from 390 to 494 GHz, and the gate-delay time was decreased from 0.83 to 0.78 ps at supply voltage of 0.6 V. This is the highest f(T) achieved for 80-nm-gate-length HEMT devices. These superior performances are attributed to the reduction of distance between gate and channel and the reduction of parasitic gate capacitances during the gate-sinking process. Moreover, such superior performances were achieved through a very simple and straightforward fabrication process with optimal epistructure of the device.
Photoluminescence studies of InAs/GaAs quantum dots covered by InGaAs layers
(2010-01-15)
Shu, G. W.
;
Wang, J. S.
;
Shen, J. L.
;
Hsiao, R. S.
;
Chen, J. F.
Photoluminescence (PL), PL excitation (PLE), and time-resolved PL were used to study effects of InGaAs layers on the optical properties of InAs/GaAs quantum dots (QDs). A rich fine structure in the excited states of confined excitons (up to n = 4 quantum states) was observed, providing useful information to study the quantum states in the InAs/GaAs QDs. A significant redshift of the PL peak energy for the QDs covered by InGaAs layers was observed, attributing to the decrease of the QD strain and the lowing of the quantum confinement. (C) 2009 Elsevier B.V. All rights reserved.

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