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dc.contributor.authorChen, Shih-Chingen_US
dc.contributor.authorChang, Ting-Changen_US
dc.contributor.authorLiu, Po-Tsunen_US
dc.contributor.authorWu, Yung-Chunen_US
dc.contributor.authorKo, Chin-Chengen_US
dc.contributor.authorYang, Sidneyen_US
dc.contributor.authorFeng, Li-Weien_US
dc.contributor.authorSze, S. M.en_US
dc.contributor.authorChang, Chun-Yenen_US
dc.contributor.authorLien, Chen-Hsinen_US
dc.date.accessioned2014-12-08T15:13:06Z-
dc.date.available2014-12-08T15:13:06Z-
dc.date.issued2007-11-19en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2813621en_US
dc.identifier.urihttp://hdl.handle.net/11536/10109-
dc.description.abstractIn this work, we studied a pi-shape gate polycrystalline silicon thin-film transistor (poly-Si TFT) with silicon-oxide-nitride-oxide-silicon (SONOS) layers and nanowire channels for the application of electric driver and nonvolatile memory. The proposed pi-gate TFT-SONOS has superior transfer characteristics and its output characteristic also exhibits the high driving current and the suppression of the kink effect. For memory application, the device can provide high program/erase efficiency and large threshold voltage shift under adequate bias operation. The enhanced performance for the pi-gate TFT-SONOS is attributed to the larger effective channel width and the number of channel corners. (C) American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titlePi-shape gate polycrystalline silicon thin-film transistor for nonvolatile memory applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2813621en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume91en_US
dc.citation.issue21en_US
dc.citation.epageen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000251105500031-
dc.citation.woscount7-
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