低維度硫族合金之電遷移與擴散行為研究

Full metadata record

DC Field	Value	Language
dc.contributor.author	謝宗雍	en_US
dc.contributor.author	HSIEH TSUNG-EONG	en_US
dc.date.accessioned	2014-12-13T10:48:01Z	-
dc.date.available	2014-12-13T10:48:01Z	-
dc.date.issued	2014	en_US
dc.identifier.govdoc	MOST103-2221-E009-057-MY2	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/101222	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=8357761&docId=447534	en_US
dc.description.sponsorship	科技部	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	低維度硫族合金之電遷移與擴散行為研究	zh_TW
dc.title	A Study of Electromigration and Diffusion Behaviors of Low-Dimensional Chalcogenides	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學材料科學與工程學系（所）	zh_TW
Appears in Collections:	Research Plans