| 標題: | 後次微米時代新興電子設計自動化技術之研究---子計畫四：應用計算智慧推理處理後深次微米時代電路設計上的可靠度挑戰(II) Coping with Reliability Challenges to Circuit Designs beyond Deep Sub-Micron Era by Computational Intelligence Reasoning(II) |
| 作者: | 溫宏斌 Wen Hung-Pin 國立交通大學電信工程學系(所) |
| 公開日期: | 2009 |
| 官方說明文件#: | NSC98-2220-E009-024 |
| URI: | http://hdl.handle.net/11536/101769 https://www.grb.gov.tw/search/planDetail?id=1910812&docId=316912 |
| Appears in Collections: | Research Plans |
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