Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 陳宏明 | en_US |
| dc.contributor.author | Chen Hung-Ming | en_US |
| dc.date.accessioned | 2014-12-13T10:50:04Z | - |
| dc.date.available | 2014-12-13T10:50:04Z | - |
| dc.date.issued | 2008 | en_US |
| dc.identifier.govdoc | NSC97-2220-E009-004 | zh_TW |
| dc.identifier.uri | http://hdl.handle.net/11536/101956 | - |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1689493&docId=291412 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.language.iso | zh_TW | en_US |
| dc.title | 先進製程技術之設計與可靠度提昇研究---子計畫三：在後佈局與測試設計所使用之良率改善技術研究(III) | zh_TW |
| dc.title | Yield Improvement Methodologies in Post-Layout Design Flow and Design for Test(III) | en_US |
| dc.type | Plan | en_US |
| dc.contributor.department | 國立交通大學電子工程學系及電子研究所 | zh_TW |
| Appears in Collections: | Research Plans | |
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