標題: | High responsivity of GaN p-i-n photodiode by using low-temperature interlayer |
作者: | Lin, J. C. Su, Y. K. Chang, S. J. Lan, W. H. Huang, K. C. Chen, W. R. Huang, C. Y. Lai, W. C. Lin, W. J. Cheng, Y. C. 電子物理學系 Department of Electrophysics |
公開日期: | 22-Oct-2007 |
摘要: | Gallium nitride p-i-n ultraviolet photodiodes with low- temperature (LT)- GaN interlayer have been fabricated. It was found that the dark current of photodiode with LT- GaN interlayer is as small as 143 pA at 5 V reverse bias. It was also found that the responsivity of the photodiode with LT- GaN interlayer can be enhanced at a small electric field (similar to 0.4 MV/cm) due to the carrier multiplication effect. The UV photocurrent gain of 13 and large ionization coefficient (alpha = 3.1 X 10(5) cm(-1)) were also observed in the detector with LT- GaN interlayer. Furthermore, we can achieve a large peak responsivity of 2.27 A/W from the photodiode with LT- GaN interlayer. (C) 2007 American Institute of Physics. |
URI: | http://dx.doi.org/10.1063/1.2800813 http://hdl.handle.net/11536/10225 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.2800813 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 91 |
Issue: | 17 |
結束頁: | |
Appears in Collections: | Articles |
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