熱輻射吸收性薄膜輻射熱性質與厚度之量測與分析

Full metadata record

DC Field	Value	Language
dc.contributor.author	林振德	en_US
dc.contributor.author	LIN JENN-DER	en_US
dc.date.accessioned	2014-12-13T10:51:27Z	-
dc.date.available	2014-12-13T10:51:27Z	-
dc.date.issued	2000	en_US
dc.identifier.govdoc	NSC89-2212-E009-022	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/102703	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=501370&docId=90407	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.subject	薄膜	zh_TW
dc.subject	吸收性介質	zh_TW
dc.subject	頻譜光學常數	zh_TW
dc.subject	傾斜入射角	zh_TW
dc.subject	Thin film	en_US
dc.subject	Absorbing media	en_US
dc.subject	Spectral optical constant	en_US
dc.subject	Oblique incidence	en_US
dc.title	熱輻射吸收性薄膜輻射熱性質與厚度之量測與分析	zh_TW
dc.title	An Analysis for Simultaneous Measurement of Spectral Optical Constants and Thickness of an Absorbing Thin Film on a Substrate	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學機械工程系	zh_TW
Appears in Collections:	Research Plans

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