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dc.contributor.author林振德en_US
dc.contributor.authorLIN JENN-DERen_US
dc.date.accessioned2014-12-13T10:51:27Z-
dc.date.available2014-12-13T10:51:27Z-
dc.date.issued2000en_US
dc.identifier.govdocNSC89-2212-E009-022zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/102703-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=501370&docId=90407en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject薄膜zh_TW
dc.subject吸收性介質zh_TW
dc.subject頻譜光學常數zh_TW
dc.subject傾斜入射角zh_TW
dc.subjectThin filmen_US
dc.subjectAbsorbing mediaen_US
dc.subjectSpectral optical constanten_US
dc.subjectOblique incidenceen_US
dc.title熱輻射吸收性薄膜輻射熱性質與厚度之量測與分析zh_TW
dc.titleAn Analysis for Simultaneous Measurement of Spectral Optical Constants and Thickness of an Absorbing Thin Film on a Substrateen_US
dc.typePlanen_US
dc.contributor.department交通大學機械工程系zh_TW
顯示於類別:研究計畫


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