1. You are Here：

Full metadata record
DC FieldValueLanguage
dc.contributor.author陳智en_US
dc.contributor.author張元蔚en_US
dc.date.accessioned2014-12-16T06:12:02Z-
dc.date.available2014-12-16T06:12:02Z-
dc.date.issued2012-11-01en_US
dc.identifier.govdocG01R027/08zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/103369-
dc.description.abstract本發明係有關於一種凸塊接點之電阻測量結構以及包含該結構之封裝基板，該電阻測量結構包括：複數個連接凸塊，係排列呈一線；至少一第一連接墊；以及至少一第二連接墊；其中，該複數個連接凸塊中之第n個連接凸塊與第n+1個連接凸塊係以該第一連接墊電性連接，該第n+1個連接凸塊與第n+2個連接凸塊係以該第二連接墊電性連接，n係為1以上之奇數；該第一連接墊係與一第一電壓量測墊連接；該第二連接墊係與一輔助連接墊連接，該輔助連接墊係與一輔助凸塊(auxiliary bump)連接，一第二電壓量測墊係連接至該輔助凸塊。zh_TW
dc.language.isozh_TWen_US
dc.title凸塊接點之電阻測量結構及包含其之封裝基板zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201243348zh_TW
Appears in Collections:Patents


Files in This Item:

  1. 201243348.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.

Related Contents
Loading...