標題: New gate-bias voltage-generating technique with threshold-voltage compensation for on-glass analog circuits in LTPS process
作者: Chen, Jung-Sheng
Ker, Ming-Dou
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: analog circuit;biasing circuit;low-temperature polycrystalline silicon (LTPS);thin-film transistor (TFT);threshold-voltage compensation;threshold-voltage variation
公開日期: 1-九月-2007
摘要: A new proposed gate-bias voltage-generating technique with threshold-voltage compensation for analog circuits in the low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) is proposed. The new proposed gate-bias voltage-generating circuit with threshold-voltage compensation has been successfully verified in an 8-mu m LTPS process. The experimental results have shown that the impact of TFT threshold-voltage variation on the biasing circuit can be reduced from 30% to 5% under a biasing voltage of 3 V. The new proposed gate-bias voltage-generating technique with thresh old-voltage compensation enables the analog circuits to be integrated and implemented by the UPS process on glass substrate for an active matrix LCD panel.
URI: http://dx.doi.org/10.1109/JDT.2007.900916
http://hdl.handle.net/11536/10380
ISSN: 1551-319X
DOI: 10.1109/JDT.2007.900916
期刊: JOURNAL OF DISPLAY TECHNOLOGY
Volume: 3
Issue: 3
起始頁: 309
結束頁: 314
顯示於類別:期刊論文


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