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dc.contributor.author李承士en_US
dc.contributor.author張翼en_US
dc.contributor.author陳克弦en_US
dc.date.accessioned2014-12-16T06:13:16Z-
dc.date.available2014-12-16T06:13:16Z-
dc.date.issued2007-07-16en_US
dc.identifier.govdocH01L029/47zh_TW
dc.identifier.govdocH01L021/285zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104070-
dc.description.abstract一種化合物半導體元件之銅金屬化之歐姆接觸電極,經過電子束蒸鍍沈積鈀(Pd)層、鍺(Ge)層及銅(Cu)層於化合物半導體元件上所組成,接著利用浮離製程(Lift-off)去除多餘之金屬及光阻,最後進行快速高溫退火過程而形成歐姆接觸電極。其中低電阻値之歐姆接觸電極係利用調整鈀層、鍺層及銅層之厚度及配合退火溫度而形成,可應用於銅金屬化製程,有效增加化合物半導體元件的散熱特性,且使生產成本降低。zh_TW
dc.language.isozh_TWen_US
dc.title化合物半導體元件之銅金屬化之歐姆接觸電極zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber200727470zh_TW
Appears in Collections:Patents


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