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dc.contributor.author張隆國en_US
dc.contributor.author蔡銘裕en_US
dc.date.accessioned2014-12-16T06:13:37Z-
dc.date.available2014-12-16T06:13:37Z-
dc.date.issued2005-08-01en_US
dc.identifier.govdocH01L029/735zh_TW
dc.identifier.govdocH01L029/735zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104239-
dc.description.abstract本發明係提供一種橫向絕緣閘雙極性電晶體結構,係使該電晶體之陽極端與陰極端皆為P^+/N^+平行對接節段,但卻為分離且對稱式之結構,若以電子/電洞路徑而言,則為電子/電洞路徑完全分離,如此可大幅提高元件之閂鎖電流,改善元件的安全操作區域。並可使該電晶體結合三維降低表面電場原理,使其陽極端/陰極端亦為P^+/N^+平行對接節段,而其漂移區則分別是N^–、P^–的平行帶狀區塊,形成一橫向絕緣閘雙極性電晶體與一逆偏PIN飛輪二極體並聯的結構,若以電子/電洞路徑而言則為電子/電洞路徑部份分離,使元件除了在截止狀態時具有高耐壓特性外,在導通狀態時亦具有閂鎖現象的抗受能力。zh_TW
dc.language.isozh_TWen_US
dc.title橫向絕緣閘雙極性電晶體結構zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber200525756zh_TW
Appears in Collections:Patents


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