Title: | Phase-locked loop with loop gain calibration, gain measurement method, gain calibration method and jitter measurement method for phase-locked loop |
Authors: | Chen Wei-Zen Chuang Shu-Chin |
Issue Date: | 14-Oct-2014 |
Abstract: | The invention provides a phase-locked loop with loop gain calibration and methods for measuring an oscillator gain, gain calibration and jitter measurement for a phase-locked loop. The method for measuring an oscillator gain of a phase-locked loop includes the steps of providing a varying code at an input end of the oscillator; outputting excess reference phase information by a reference phase integral path and outputting excess feedback phase information based on the varying code by a feedback phase integral path; and obtaining an estimated gain information of the oscillator based on the excess reference phase information and the excess feedback phase information. |
Gov't Doc #: | H03L007/08 G01R025/00 |
URI: | http://hdl.handle.net/11536/104334 |
Patent Country: | USA |
Patent Number: | 08860478 |
Appears in Collections: | Patents |
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