Title: Phase-locked loop with loop gain calibration, gain measurement method, gain calibration method and jitter measurement method for phase-locked loop
Authors: Chen Wei-Zen
Chuang Shu-Chin
Issue Date: 14-Oct-2014
Abstract: The invention provides a phase-locked loop with loop gain calibration and methods for measuring an oscillator gain, gain calibration and jitter measurement for a phase-locked loop. The method for measuring an oscillator gain of a phase-locked loop includes the steps of providing a varying code at an input end of the oscillator; outputting excess reference phase information by a reference phase integral path and outputting excess feedback phase information based on the varying code by a feedback phase integral path; and obtaining an estimated gain information of the oscillator based on the excess reference phase information and the excess feedback phase information.
Gov't Doc #: H03L007/08
G01R025/00
URI: http://hdl.handle.net/11536/104334
Patent Country: USA
Patent Number: 08860478
Appears in Collections:Patents


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