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dc.contributor.authorChen Chihen_US
dc.contributor.authorTu King-Ningen_US
dc.date.accessioned2014-12-16T06:13:57Z-
dc.date.available2014-12-16T06:13:57Z-
dc.date.issued2013-11-05en_US
dc.identifier.govdocG21K005/08zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104426-
dc.description.abstractThe present invention relates to a specimen box for an electron microscope, which comprises a first substrate, a second substrate, and a metal adhesion layer. The first substrate has a first surface, a second surface, a first concave, and one or more first through holes, wherein the first through hole penetrates through the first substrate. The second substrate has a third surface, a forth surface, and a second concave. Besides, the metal adhesion layer is disposed between the first substrate and the second substrate to form a space for a specimen placed therein. In addition, the specimen box of the present invention further comprises one or more plugs. When the plug is assembled into the first through hole to seal the specimen box, the in-situ observation can be accomplished by using an electron microscope.zh_TW
dc.language.isozh_TWen_US
dc.titleSpecimen box for electron microscopezh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08575566zh_TW
Appears in Collections:Patents


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