完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Jiang Hui-Ru | en_US |
dc.contributor.author | Chang Hua-Yu | en_US |
dc.contributor.author | Chang Chih-Long | en_US |
dc.date.accessioned | 2014-12-16T06:14:03Z | - |
dc.date.available | 2014-12-16T06:14:03Z | - |
dc.date.issued | 2013-03-19 | en_US |
dc.identifier.govdoc | G06F017/50 | zh_TW |
dc.identifier.govdoc | G06F011/22 | zh_TW |
dc.identifier.govdoc | G06F009/455 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/104497 | - |
dc.description.abstract | A method for designing an optimal wiring topology for electromigration avoidance is disclosed. The wiring topology includes multiple sources, multiple sinks and multiple wires. The method includes the following steps: A feasible wire, a wire of the shortest length connecting each pair of source and sink, is calculated, and the capacity of each feasible wire is decided. An initial feasible topology is found. A flow network is created based on the initial topology. Negative cycles are iteratively checked and removed until no more negative cycles. | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.title | Designing an optimal wiring topology for electromigration avoidance | zh_TW |
dc.type | Patents | en_US |
dc.citation.patentcountry | USA | zh_TW |
dc.citation.patentnumber | 08402420 | zh_TW |
顯示於類別: | 專利資料 |