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dc.contributor.authorJiang Hui-Ruen_US
dc.contributor.authorChang Hua-Yuen_US
dc.contributor.authorChang Chih-Longen_US
dc.date.accessioned2014-12-16T06:14:03Z-
dc.date.available2014-12-16T06:14:03Z-
dc.date.issued2013-03-19en_US
dc.identifier.govdocG06F017/50zh_TW
dc.identifier.govdocG06F011/22zh_TW
dc.identifier.govdocG06F009/455zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104497-
dc.description.abstractA method for designing an optimal wiring topology for electromigration avoidance is disclosed. The wiring topology includes multiple sources, multiple sinks and multiple wires. The method includes the following steps: A feasible wire, a wire of the shortest length connecting each pair of source and sink, is calculated, and the capacity of each feasible wire is decided. An initial feasible topology is found. A flow network is created based on the initial topology. Negative cycles are iteratively checked and removed until no more negative cycles.zh_TW
dc.language.isozh_TWen_US
dc.titleDesigning an optimal wiring topology for electromigration avoidancezh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08402420zh_TW
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