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dc.contributor.authorCHUANG Ching-Teen_US
dc.contributor.authorYANG Hao-Ien_US
dc.contributor.authorLU Chien-Yuen_US
dc.contributor.authorCHEN Chien-Henen_US
dc.contributor.authorCHANG Chi-Shinen_US
dc.contributor.authorHUANG Po-Tsangen_US
dc.contributor.authorLAI Shu-Linen_US
dc.contributor.authorHWANG Weien_US
dc.contributor.authorJOU Shyh-Jyeen_US
dc.contributor.authorTU Ming-Hsienen_US
dc.date.accessioned2014-12-16T06:14:49Z-
dc.date.available2014-12-16T06:14:49Z-
dc.date.issued2014-03-20en_US
dc.identifier.govdocG11C007/02zh_TW
dc.identifier.govdocG11C011/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104938-
dc.description.abstractA static random access memory includes a pre-charger, a first cell column array/peripheral circuit, and a first ripple buffer. The pre-charger is connected to a first local bit line in order to pre-charge the first local bit line. The first cell column array/peripheral circuit is connected to the first local bit line and has a plurality of cells for temporarily storing data. The cells are connected to the first local bit line. The first ripple buffer is connected to the first local bit line and a second local bit line in order to send the data from the first local bit line to the second local bit line.zh_TW
dc.language.isozh_TWen_US
dc.titleSTATIC RANDOM ACCESS MEMORY WITH RIPPLE BIT LINES/SEARCH LINES FOR IMROVING CURRENT LEAKAGE/VARIATION TOLERANCE AND DENSITY/PERFORMANCEzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20140078818zh_TW
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