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dc.contributor.authorChen Wei-Zenen_US
dc.contributor.authorChuang Shu-Chinen_US
dc.date.accessioned2014-12-16T06:14:50Z-
dc.date.available2014-12-16T06:14:50Z-
dc.date.issued2014-03-20en_US
dc.identifier.govdocH03L007/08zh_TW
dc.identifier.govdocG01R025/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/104940-
dc.description.abstractThe invention provides a phase-locked loop with loop gain calibration and methods for measuring an oscillator gain, gain calibration and jitter measurement for a phase-locked loop. The method for measuring an oscillator gain of a phase-locked loop includes the steps of providing a varying code at an input end of the oscillator; outputting excess reference phase information by a reference phase integral path and outputting excess feedback phase information based on the varying code by a feedback phase integral path; and obtaining an estimated gain information of the oscillator based on the excess reference phase information and the excess feedback phase information.zh_TW
dc.language.isozh_TWen_US
dc.titlePHASE-LOCKED LOOP WITH LOOP GAIN CALIBRATION, GAIN MEASUREMENT METHOD, GAIN CALIBRATION METHOD AND JITTER MEASUREMENT METHOD FOR PHASE-LOCKED LOOPzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20140077849zh_TW
Appears in Collections:Patents


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