標題: Oscillator based on a 6T SRAM for measuring the Bias Temperature Instability
作者: Chuang Ching-Te
Jou Shyh-Jye
Hwang Wei
Tsai Ming-Chien
Lin Yi-Wei
Yang Hao-I
Tu Ming-Hsien
Shih Wei-Chiang
Lien Nan-Chun
Lee Kuen-Di
公開日期: 29-Aug-2013
摘要: The present invention provides an oscillator which is based on a 6T SRAM for measuring the Bias Temperature Instability. The oscillator includes a first control unit, a first inverter, a second control unit, and a second inverter. The first control unit is coupled with the first inverter. The second control unit is coupled with the second inverter. The first control unit and the second control unit is used to control the first inverter and the second inverter being selected, biased, and connected respectively, so that the NBTI and the PBTI of the SRAM can be measured separately, and the real time stability of the SRAM can be monitored immediately.
官方說明文件#: H03K003/36
URI: http://hdl.handle.net/11536/105006
專利國: USA
專利號碼: 20130222071
Appears in Collections:Patents


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