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dc.contributor.authorLEE, Wei Ien_US
dc.contributor.authorHuang, Hsin Hsiungen_US
dc.contributor.authorChen, Kuei Mingen_US
dc.contributor.authorYeh, Yen Hsienen_US
dc.date.accessioned2014-12-16T06:15:32Z-
dc.date.available2014-12-16T06:15:32Z-
dc.date.issued2010-10-07en_US
dc.identifier.govdocH01L029/20zh_TW
dc.identifier.govdocH01L021/20zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105378-
dc.description.abstractA method for growing a Group III-V nitride film and a structure thereof are presented. The method is carried out by hydride vapor phase epitaxy (HVPE). The method includes the steps of, inter alia, slowly epitaxially growing a temperature ramping nitride layer on a substrate by rising a first growth temperature of 900-950° C. to a second growth temperature of 1000-1050° C. at a temperature-rising rate of 0.5-10° C./min. The lattice quality of the temperature ramping nitride layer is slowly transformed with the layer height, so that a stress induced by lattice mismatch between a sapphire substrate and a gallium nitride (GaN) layer is relieved.zh_TW
dc.language.isozh_TWen_US
dc.titleMETHOD FOR GROWING GROUP III-V NITRIDE FILM AND STRUCTURE THEREOFzh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20100252834zh_TW
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