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dc.contributor.author張翼en_US
dc.contributor.author郭建億en_US
dc.contributor.author許恆通en_US
dc.date.accessioned2014-12-16T06:15:46Z-
dc.date.available2014-12-16T06:15:46Z-
dc.date.issued2013-08-01en_US
dc.identifier.govdocH01L029/778zh_TW
dc.identifier.govdocH01L021/335zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105487-
dc.description.abstract一種高電子遷移率電晶體,其包含基板、緩衝層、通道層、間隙層、蕭特基層以及覆蓋層。緩衝層形成於基板上。通道層形成於緩衝層上,且包含超晶格結構,此超晶格結構係由複數層砷化銦鎵薄膜與複數層砷化銦薄膜彼此交替堆疊形成。間隙層形成於通道層上,蕭特基層形成於間隙層上,而覆蓋層則形成於蕭特基層上。此外,一種製作高電子遷移率電晶體之方法亦在此揭露。zh_TW
dc.language.isozh_TWen_US
dc.title高電子遷移率電晶體及其製作方法zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI404209zh_TW
Appears in Collections:Patents


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