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dc.contributor.authorChen, Chihen_US
dc.contributor.authorYeh, Everett Chang-Chingen_US
dc.contributor.authorTu, King-Ningen_US
dc.date.accessioned2014-12-16T06:16:14Z-
dc.date.available2014-12-16T06:16:14Z-
dc.date.issued2006-02-09en_US
dc.identifier.govdocH01L023/48zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/105714-
dc.description.abstractThis invention provides a process for protecting solder joints, comprising forming an UBM or pad metallurgy in solder joints and then further forming a small solder bump on UBM or pad metallurgy between substrate and chip. Wherein a material of high electric resistance is coated at the ends of UBM or pad metallurgy where substrate is connected to chip, as to equalize the current distribution of solder bump, therefore the electromigration resistance of solder joints is improved by suppressing the current crowding and joule heating phenomenon.zh_TW
dc.language.isozh_TWen_US
dc.titleProcess for protecting solder joints and structure for alleviating electromigration and joule heating in solder jointszh_TW
dc.typePatentsen_US
dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20060027933zh_TW
Appears in Collections:Patents


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