Title: Process for protecting solder joints and structure for alleviating electromigration and joule heating in solder joints
Authors: Chen, Chih
Yeh, Everett Chang-Ching
Tu, King-Ning
Issue Date: 9-Feb-2006
Abstract: This invention provides a process for protecting solder joints, comprising forming an UBM or pad metallurgy in solder joints and then further forming a small solder bump on UBM or pad metallurgy between substrate and chip. Wherein a material of high electric resistance is coated at the ends of UBM or pad metallurgy where substrate is connected to chip, as to equalize the current distribution of solder bump, therefore the electromigration resistance of solder joints is improved by suppressing the current crowding and joule heating phenomenon.
Gov't Doc #: H01L023/48
URI: http://hdl.handle.net/11536/105714
Patent Country: USA
Patent Number: 20060027933
Appears in Collections:Patents


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