標題: Fabrication of true apodized fiber bragg grating using a new two-beam interferometer with polarization control
作者: Chuang, Kai-Ping
Sheu, Lih-Gen
Tsai, Meng-Chang
Lai, Yinchieh
公開日期: 14-Jul-2005
摘要: The present invention provides a two-beam interference exposure system that can be simply adjusted by rotating only one mirror. By placing a half-wave plate in one of the interference arms and precisely scanning the relative fiber position, the present invention can expose true apodized fiber Bragg gratings in a single scan by simultaneously rotating the angle of the half-wave plate. By rotationally switching the fast and slow axes of the half-wave plate, the present invention can also expose n-phase-shifted fiber grating by the same system.
官方說明文件#: G02B006/34
URI: http://hdl.handle.net/11536/105738
專利國: USA
專利號碼: 20050152646
Appears in Collections:Patents


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