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dc.contributor.authorHuang, S.-Y.en_US
dc.contributor.authorLee, S. F.en_US
dc.contributor.authorHsu, S. Y.en_US
dc.contributor.authorYao, Y. D.en_US
dc.date.accessioned2014-12-08T15:13:41Z-
dc.date.available2014-12-08T15:13:41Z-
dc.date.issued2007-07-01en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.76.024521en_US
dc.identifier.urihttp://hdl.handle.net/11536/10579-
dc.description.abstractThe quantitative interface resistance between polycrystalline ferromagnetic Co and NbxTi1-x, with x=1, 0.6, and 0.4, is measured and analyzed at 4.2 K. Both the superconducting and normal states of NbxTi1-x, respectively, above and below the superconducting critical thickness, are studied with current flowing perpendicular to the interface. A one-band series-resistance model is used to analyze our data. The interface transparencies in terms of the ratio between interface resistance and various physical quantities are discussed.en_US
dc.language.isoen_USen_US
dc.titleInterface resistance and transparency in ferromagnet/superconductor Co/NbxTi1-x multilayers (x = 1, 0.6, and 0.4)en_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.76.024521en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume76en_US
dc.citation.issue2en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000248496200114-
dc.citation.woscount5-
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