Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 林怡欣 | en_US |
| dc.date.accessioned | 2014-12-16T06:16:56Z | - |
| dc.date.available | 2014-12-16T06:16:56Z | - |
| dc.date.issued | 2014-09-21 | en_US |
| dc.identifier.govdoc | G01N033/487 | zh_TW |
| dc.identifier.govdoc | G02F001/13 | zh_TW |
| dc.identifier.uri | http://hdl.handle.net/11536/106183 | - |
| dc.language.iso | zh_TW | en_US |
| dc.title | 具有液晶聚合物薄膜之檢測裝置及檢測方法 | zh_TW |
| dc.type | Patents | en_US |
| dc.citation.patentcountry | TWN | zh_TW |
| dc.citation.patentnumber | I453410 | zh_TW |
| Appears in Collections: | Patents | |
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