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dc.contributor.author劉柏村en_US
dc.contributor.author許沁卉en_US
dc.contributor.author范揚順en_US
dc.date.accessioned2014-12-16T06:17:43Z-
dc.date.available2014-12-16T06:17:43Z-
dc.date.issued2014-05-16en_US
dc.identifier.govdocG11C013/00zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/106553-
dc.description.abstract電阻式記憶體裝置及其操作方法在此揭露。電阻式記憶體裝置包括至少一個電阻式記憶體元件以及控制電路。電阻式記憶體元件包括底電極、非晶態氧化銦鎵鋅(amorphous Indium-Gallium-Zinc-Oxide,a-IGZO)層、鈦層以及頂電極。非晶態氧化銦鎵鋅層配置於底電極上。鈦層配置於非晶態氧化銦鎵鋅層。頂電極配置於鈦層上。控制電路用以提供電訊號給電阻式記憶體元件,以改變電阻式記憶體元件的電阻値。zh_TW
dc.language.isozh_TWen_US
dc.title電阻式記憶體裝置及其操作方法zh_TW
dc.typePatentsen_US
dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201419279zh_TW
Appears in Collections:Patents


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