美國專利法非顯而易知性之新觀點：相同條件下的客觀指標

Full metadata record

DC Field	Value	Language
dc.contributor.author	劉懿嫻	en_US
dc.contributor.author	Liu, Yi-hsien	en_US
dc.date.accessioned	2014-12-19T03:51:09Z	-
dc.date.available	2014-12-19T03:51:09Z	-
dc.date.issued	2010	en_US
dc.identifier.issn	1811-3095	en_US
dc.identifier.uri	http://hdl.handle.net/11536/107635	-
dc.identifier.uri	http://www.itl.nctu.edu.tw/tlr_n/ch/list7_2.html	en_US
dc.subject	進步性	zh_TW
dc.subject	顯而易知	zh_TW
dc.subject	後見偏差	zh_TW
dc.subject	相乘效果標準	zh_TW
dc.subject	TSM法則	zh_TW
dc.subject	顯可嘗試法則	zh_TW
dc.subject	輔助性判斷因素	zh_TW
dc.subject	實證研究	zh_TW
dc.subject	Obviousness	zh_TW
dc.subject	Hindsight bias	zh_TW
dc.subject	Synergy test	zh_TW
dc.subject	TSM test	zh_TW
dc.subject	Obvious-to-Try	zh_TW
dc.subject	Secondary consideration	zh_TW
dc.subject	Patent	zh_TW
dc.subject	Empirical study	zh_TW
dc.title	美國專利法非顯而易知性之新觀點：相同條件下的客觀指標	zh_TW
dc.identifier.journal	科技法學評論	zh_TW
dc.citation.volume	7	en_US
dc.citation.issue	2	en_US
dc.citation.spage	181	en_US
dc.citation.epage	219	en_US
dc.contributor.department	科技法律研究所	zh_TW
dc.contributor.department	Institute of Technology Law	en_US
Appears in Collections:	Technology Law Review

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