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dc.contributor.authorWu, Chun-Yuen_US
dc.contributor.authorLiao, Ta-Chuanen_US
dc.contributor.authorYu, Ming-Hen_US
dc.contributor.authorChen, Sheng-Kaien_US
dc.contributor.authorTsai, Chung-Minen_US
dc.contributor.authorCheng, Huang-Chungen_US
dc.date.accessioned2014-12-08T15:14:27Z-
dc.date.available2014-12-08T15:14:27Z-
dc.date.issued2010-05-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.microrel.2010.01.016en_US
dc.identifier.urihttp://hdl.handle.net/11536/11010-
dc.description.abstractA novel omega-shaped-gated (Omega-Gate) poly-Si thin-film-transistor (TFT) silicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile memory devices fabricated with a simple process have been proposed for the first time. The Omega-Gate structure inherently covered two sharp corners manufactured simply via a side-wall spacer formation. Due to the sharp corner geometry, the local electric fields across the tunneling oxide could be enhanced effectively, thus improving the memory performance. Based on this field enhanced scheme, the Omega-Gate TFT SONOS revealed excellent program/erase (P/E) efficiency and larger memory window as compared to the conventional planar (CP) counterparts. In addition, owing to the better gate controllability, the Omega-Gate TFT SONOS also exhibited superior transistor performance with a much higher on-current, smaller threshold voltage, and steeper subthreshold swing. Therefore, such an Omega-Gate TFT SONOS memory is very promising for the embedded flash on the system-on-panel applications. (C) 2010 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleField enhancement of omega-shaped-gated poly-Si TFT SONOS memory fabricated by a simple sidewall spacer formationen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.microrel.2010.01.016en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume50en_US
dc.citation.issue5en_US
dc.citation.spage704en_US
dc.citation.epage708en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000278728700030-
Appears in Collections:Conferences Paper


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