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dc.contributor.authorChao, Yu-Fayeen_US
dc.contributor.authorHan, Chien-Yuanen_US
dc.date.accessioned2014-12-08T15:14:40Z-
dc.date.available2014-12-08T15:14:40Z-
dc.date.issued2007-02-20en_US
dc.identifier.issn0925-4005en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.snb.2006.04.073en_US
dc.identifier.urihttp://hdl.handle.net/11536/11115-
dc.description.abstractA total internal reflection ellipsometer equipped with a photoelastic modulator (PEM) is installed to investigate the chemical activation and antibody immobilization process on thin gold films. We set up two detection channels in this configuration: one for real-time monitoring with a data rate of 1 set per second, and the other for post flight analysis with a data rate of 25,000 sets per second. More detailed information has been obtained through the post flight analysis technique during the chemical activation process. This surface plasmon resonance enhanced PEM ellipsometry provides higher sensitivity and temporal resolution. It is feasible to resolve a faster reaction such as chemical reaction or protein folding by the post flight analysis technique. (c) 2006 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectellipsometryen_US
dc.subjectsurface plasmon resonanceen_US
dc.subjectphotoelastic modulatoren_US
dc.titlePost flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometryen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.snb.2006.04.073en_US
dc.identifier.journalSENSORS AND ACTUATORS B-CHEMICALen_US
dc.citation.volume121en_US
dc.citation.issue2en_US
dc.citation.spage490en_US
dc.citation.epage495en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000244545100020-
dc.citation.woscount2-
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