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dc.contributor.authorLin, J. C.en_US
dc.contributor.authorSu, Y. K.en_US
dc.contributor.authorChang, S. J.en_US
dc.contributor.authorLan, W. H.en_US
dc.contributor.authorHuang, K. C.en_US
dc.contributor.authorChen, W. R.en_US
dc.contributor.authorCheng, Y. C.en_US
dc.contributor.authorLin, W. J.en_US
dc.date.accessioned2014-12-08T15:14:50Z-
dc.date.available2014-12-08T15:14:50Z-
dc.date.issued2007-02-01en_US
dc.identifier.issn1751-8768en_US
dc.identifier.urihttp://dx.doi.org/10.1049/iet-opt:20060031en_US
dc.identifier.urihttp://hdl.handle.net/11536/11194-
dc.description.abstractThin InGaN epitaxial layers and GaN-based light-emitting diodes (LEDs) on conventional and vicinal cut sapphire substrates are prepared. It is found that indium atoms are distributed much more uniformly in the samples prepared on vicinal cut sapphire substrates. It is also found that stronger electroluminescence intensity can be achieved without the band-filling effect of localised states from the LEDs with vicinal cut sapphire substrate. With 20 mA current injection, it is found that 44% electroluminescence intensity enhancement can be achieved by using the 1 degrees tilted sapphire substrate.en_US
dc.language.isoen_USen_US
dc.titleGaN-based light-emitting diodes prepared on vicinal sapphire substratesen_US
dc.typeArticleen_US
dc.identifier.doi10.1049/iet-opt:20060031en_US
dc.identifier.journalIET OPTOELECTRONICSen_US
dc.citation.volume1en_US
dc.citation.issue1en_US
dc.citation.spage23en_US
dc.citation.epage26en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000247072400005-
dc.citation.woscount8-
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