完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Shieh, Gwowen | en_US |
dc.contributor.author | Jan, Show-Li | en_US |
dc.contributor.author | Randles, Ronald H. | en_US |
dc.date.accessioned | 2014-12-08T15:14:58Z | - |
dc.date.available | 2014-12-08T15:14:58Z | - |
dc.date.issued | 2007 | en_US |
dc.identifier.issn | 0094-9655 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/11255 | - |
dc.identifier.uri | http://dx.doi.org/10.1080/10629360600635245 | en_US |
dc.description.abstract | The problem of calculating power and sample size for the Wilcoxon signed-rank test is discussed. The exact variance large-sample method is examined and explicit formulas are derived for observations from uniform, normal and Laplace distributions. Numerical results are presented to evaluate the exact variance procedure and compare its performance with two simplified approximations that have been suggested in the statistical literature. From the simulation results, it is evident that the exact variance approach is more accurate than the two approximate methods. To facilitate practical use, tabulated values of the estimated sample sizes are provided. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | large-sample approximation | en_US |
dc.subject | nonparametric method | en_US |
dc.subject | one-sample location problem | en_US |
dc.title | Power and sample size determinations for theWilcoxon signed-rank test | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1080/10629360600635245 | en_US |
dc.identifier.journal | JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION | en_US |
dc.citation.volume | 77 | en_US |
dc.citation.issue | 8 | en_US |
dc.citation.spage | 717 | en_US |
dc.citation.epage | 724 | en_US |
dc.contributor.department | 管理科學系 | zh_TW |
dc.contributor.department | Department of Management Science | en_US |
dc.identifier.wosnumber | WOS:000249549200007 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |