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dc.contributor.authorChen, Shih-Lunen_US
dc.contributor.authorKer, Ming-Douen_US
dc.date.accessioned2014-12-08T15:14:59Z-
dc.date.available2014-12-08T15:14:59Z-
dc.date.issued2007-01-01en_US
dc.identifier.issn1057-7130en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSII.2006.883202en_US
dc.identifier.urihttp://hdl.handle.net/11536/11265-
dc.description.abstractWith a 3.3-V interface, such as PCI-X application, high-voltage overstress on the gate oxide is a serious reliability problem in designing I/O circuits by using only 1/2.5-V low-voltage devices in a 0.13-mu m CMOS process. Thus, a new output buffer realized with low-voltage (1- and 2.5-V) devices to drive high-voltage signals for 3.3-V applications is proposed in this paper. The proposed output buffer has been fabricated in a 0.13-mu m 1/2.5-V 1P8M CMOS process with Cu interconnects. The experimental results have confirmed that the proposed output buffer can be successfully operated at 133 MHz without suffering high-voltage gate-oxide overstress in the 3.3-V interface. In addition, a new level converter that is realized with only 1- and 2.5-V devices that can convert 0/1-V voltage swing to 1/3.3-V voltage swing is also presented in this paper. The experimental results have also confirmed that the proposed level converter can be operated correctly.en_US
dc.language.isoen_USen_US
dc.subjectgate-oxide reliabilityen_US
dc.subjectlevel converteren_US
dc.subjectmixed-voltage I/Oen_US
dc.subjectoutput bufferen_US
dc.titleAn output buffer for 3.3-V applications in a 0.13-mu m 1/2.5-V CMOS processen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCSII.2006.883202en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFSen_US
dc.citation.volume54en_US
dc.citation.issue1en_US
dc.citation.spage14en_US
dc.citation.epage18en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000243890700004-
dc.citation.woscount15-
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