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dc.contributor.authorKe, W. C.en_US
dc.contributor.authorLee, L.en_US
dc.contributor.authorChen, C. Y.en_US
dc.contributor.authorTsai, W. C.en_US
dc.contributor.authorChang, W. -H.en_US
dc.contributor.authorChou, W. C.en_US
dc.contributor.authorLee, M. C.en_US
dc.contributor.authorChen, W. K.en_US
dc.date.accessioned2014-12-08T15:15:12Z-
dc.date.available2014-12-08T15:15:12Z-
dc.date.issued2006-12-25en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.2425038en_US
dc.identifier.urihttp://hdl.handle.net/11536/11421-
dc.description.abstractStructural and photoluminescence (PL) properties of InN dots grown on GaN by metal organic vapor phase epitaxy using the flow-rate modulation technique, and their dependence on growth conditions, were investigated. An ammonia (NH3) background flow was intentionally supplied during indium deposition periods to control the kinetics of adatoms and hence the morphology of InN dots. Samples prepared under lower NH3 background flows generally exhibit narrower and more intense PL signals peaked at lower emission energies. The authors point out that the NH3 background flow is an important parameter that controls not only the nucleation process but also the emission property of InN dots. (c) 2006 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleImpacts of ammonia background flows on structural and photoluminescence properties of InN dots grown on GaN by flow-rate modulation epitaxyen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.2425038en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume89en_US
dc.citation.issue26en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000243157600098-
dc.citation.woscount16-
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