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dc.contributor.authorSu, C. -T.en_US
dc.contributor.authorYang, C. -H.en_US
dc.date.accessioned2014-12-08T15:15:22Z-
dc.date.available2014-12-08T15:15:22Z-
dc.date.issued2006-11-15en_US
dc.identifier.issn0020-7543en_US
dc.identifier.urihttp://dx.doi.org/10.1080/00207540600619726en_US
dc.identifier.urihttp://hdl.handle.net/11536/11544-
dc.description.abstractYield control plays an important role in the TFT-LCD manufacturing firms, and the post-mapping operation is a crucial step. The post-mapping operation combines one TFT plate and one CF plate to form a LCD. Each TFT and CF plate is divided into a number of panels. The LCD panel is acceptable only when both TFT and CF panels are good. The TFT-LCD manufacturing firms use the sorter, a kind of robot, to increase the yield for matching TFT and CF plates. Evidently, there will be a great loss if a random mapping policy is executed. In this study, we first apply two of the most popular meta-heuristic methods to solve the post-mapping problem: Genetic Algorithm (GA) and Simulated Annealing ( SA). However, when the number of matched cassettes is large, the number of ways for choosing different matched objects will become so enormous that the initial population in GA ( or initial solution in SA) should be selected with a proper procedure. That is, we propose a two-phased GA and SA to improve the performance of the initial population. The basic concept of phase one is to generate an efficient initial population ( or initial solution). In phase one, the initial population is created based on the optimal solution to the cassette-matching problem. In phase two, we perform GA ( or SA) with the initial population created in phase one. The four different heuristic algorithms are tested for the same data to compare the various ports in the post-mapping yield control problem. The result shows that proposed two-phased algorithms provide a more excellent solution than GA and SA.en_US
dc.language.isoen_USen_US
dc.subjectliquid crystal display (LCD)en_US
dc.subjectpost mappingen_US
dc.subjectthin film transistor (TFT)en_US
dc.subjectcolor filter (CF)en_US
dc.subjectlinear programmingen_US
dc.subjectgenetic algorithmen_US
dc.subjectsimulated annealingen_US
dc.titleTwo-phased meta-heuristic methods for the post-mapping yield control problemen_US
dc.typeArticleen_US
dc.identifier.doi10.1080/00207540600619726en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF PRODUCTION RESEARCHen_US
dc.citation.volume44en_US
dc.citation.issue22en_US
dc.citation.spage4837en_US
dc.citation.epage4854en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000241266000009-
dc.citation.woscount0-
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