標題: | Production of neutral fragments of gaseous SiCl4 following Si 2p core-level excitation studied by dispersed fluorescence spectroscopy |
作者: | Lu, K. T. Chen, J. M. Lee, J. M. Ho, S. C. Chang, H. W. 電子物理學系 Department of Electrophysics |
公開日期: | 1-十一月-2006 |
摘要: | State-specific dissociation dynamics for ionic fragments and excited fragments of gaseous SiCl4 following Si 2p core-level excitation have been characterized by the dispersed UV/optical fluorescence spectroscopy and photionization mass spectroscopy. The Si 2p core-to-Rydberg excitation leads to a noteworthy production of excited atomic fragments, neutral and ionic (Si-*, Si+*). In particular, the excited neutral atomic fragments Si* are significantly reinforced. The Si 2p core-to-valence excitation generates an enhancement of excited molecular-ion SiCl4+. The experimental results provide deeper insight into the dissociation dynamics for excited neutral fragments of molecules via core-level excitation. (c) 2006 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.radphyschem.2006.09.001 http://hdl.handle.net/11536/11563 |
ISSN: | 0969-806X |
DOI: | 10.1016/j.radphyschem.2006.09.001 |
期刊: | RADIATION PHYSICS AND CHEMISTRY |
Volume: | 75 |
Issue: | 11 |
起始頁: | 2058 |
結束頁: | 2062 |
顯示於類別: | 會議論文 |