統計資料
總造訪次數
| 檢視 | |
|---|---|
| ICP-induced defects in GaN characterized by capacitance analysis | 105 |
本月總瀏覽
檔案下載
| 檢視 | |
|---|---|
| 000243272000002.pdf | 29 |
國家瀏覽排行
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|---|---|
| 中國 | 95 |
| 美國 | 9 |
| 香港 | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Edmond | 3 |
| Kensington | 3 |
| Menlo Park | 3 |
| Central District | 1 |
| 檢視 | |
|---|---|
| ICP-induced defects in GaN characterized by capacitance analysis | 105 |
| 檢視 | |
|---|---|
| 000243272000002.pdf | 29 |
| 檢視 | |
|---|---|
| 中國 | 95 |
| 美國 | 9 |
| 香港 | 1 |
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Edmond | 3 |
| Kensington | 3 |
| Menlo Park | 3 |
| Central District | 1 |