完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Huang, Annie T. | en_US |
dc.contributor.author | Chou, Chung-Kuang | en_US |
dc.contributor.author | Chen, Chih | en_US |
dc.date.accessioned | 2014-12-08T15:15:30Z | - |
dc.date.available | 2014-12-08T15:15:30Z | - |
dc.date.issued | 2006-11-01 | en_US |
dc.identifier.issn | 1521-3323 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TADVP.2006.879427 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/11600 | - |
dc.description.abstract | We have developed an easy, low-cost, and low-temperature optoelectronic hermetic packaging technology utilizing the eutectic SnPb solder and the Cr/Ni/Cu bonding pad. Bonding characteristics of the design were investigated in three different setups: silicon-silicon, silicon-glass, and glass-glass samples. Hermeticity was achieved at 200 degrees C without flux for all samples during the final bonding process. The bonding pads did not dewet during or after the reflow process. By utilizing the eutectic SnPb solder, the self-alignment process can be achieved. Because the bonding process was conducted through visual alignment, original misalignment was estimated to be more than 100 mu m. The surface tension of melting solder during the reflow process allowed the samples to self-align and obtain a misalignment of less than 20 mu m after solidification, which was 4% of the entire solder width. The bonding strength of the three setups ranged from 3 to 10 MPa. Among the three setups, glass-glass samples appear to have the strongest bonding strength. This low-temperature and cost-effective soldering process has demonstrated its feasibility and potential utilization in optoelectronic packaging. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | flux-free | en_US |
dc.subject | hermetic packaging | en_US |
dc.subject | integrated circuit packaging | en_US |
dc.subject | semiconductor device packaging | en_US |
dc.subject | soldering | en_US |
dc.subject | thin-film circuit packaging | en_US |
dc.title | Hermetic packaging using eutectic SnPb solder and Cr/Ni/Cu metallurgy layer | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TADVP.2006.879427 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON ADVANCED PACKAGING | en_US |
dc.citation.volume | 29 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 760 | en_US |
dc.citation.epage | 765 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000241965300013 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |