標題: | Precision measures for processes with multiple manufacturing lines |
作者: | Pearn, W. L. Chang, C. S. 工業工程與管理學系 Department of Industrial Engineering and Management |
公開日期: | 1-十月-2006 |
摘要: | Process capability indices C-p, and C-pk have been popularly used in the manufacturing industry for providing measures of process potential and performance. The precision index C-p is used to measure product quality consistency, while the yield index C-pk is used to provide measures of percentage of product conforming to manufacturing specifications. Properties of C-p for processes with a single manufacturing line have been investigated extensively. However, research on properties of C-p for processes with multiple manufacturing lines have been neglected. In this paper, we consider the precision index C-p for processes with three manufacturing lines. We develop a practical procedure for process precision testing to determine whether a process meets the precision requirement preset in the factory. An application example is given. |
URI: | http://dx.doi.org/10.1007/s00170-005-0145-3 http://hdl.handle.net/11536/11719 |
ISSN: | 0268-3768 |
DOI: | 10.1007/s00170-005-0145-3 |
期刊: | INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY |
Volume: | 30 |
Issue: | 11-12 |
起始頁: | 1202 |
結束頁: | 1210 |
顯示於類別: | 期刊論文 |