標題: Precision measures for processes with multiple manufacturing lines
作者: Pearn, W. L.
Chang, C. S.
工業工程與管理學系
Department of Industrial Engineering and Management
公開日期: 1-十月-2006
摘要: Process capability indices C-p, and C-pk have been popularly used in the manufacturing industry for providing measures of process potential and performance. The precision index C-p is used to measure product quality consistency, while the yield index C-pk is used to provide measures of percentage of product conforming to manufacturing specifications. Properties of C-p for processes with a single manufacturing line have been investigated extensively. However, research on properties of C-p for processes with multiple manufacturing lines have been neglected. In this paper, we consider the precision index C-p for processes with three manufacturing lines. We develop a practical procedure for process precision testing to determine whether a process meets the precision requirement preset in the factory. An application example is given.
URI: http://dx.doi.org/10.1007/s00170-005-0145-3
http://hdl.handle.net/11536/11719
ISSN: 0268-3768
DOI: 10.1007/s00170-005-0145-3
期刊: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume: 30
Issue: 11-12
起始頁: 1202
結束頁: 1210
顯示於類別:期刊論文


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