| 標題: | Nanomechanical characteristics of BaxSr1-xTiO3 thin films |
| 作者: | Jian, Sheng-Rui Chang, Win-Jin Fang, Te-Hua Ji, Liang-Wen Hsiao, Yu-Jen Chang, Yee-Shin 電子物理學系 Department of Electrophysics |
| 關鍵字: | BST;XRD;AFM |
| 公開日期: | 15-七月-2006 |
| 摘要: | The nanomechanical properties of barium strontium titanate (BaxSr1-xTiO3, x=0-1) deposited on a silicon substrate were investigated using the metalorganic deposition method. The characteristics of the BaxSr1-xTiO3 thin film's crystalline structure and surface roughness were achieved by means of X-ray diffraction (XRD) and atomic force microscopy (AFM). The results indicated that as the Ba content was decreased and therefore the Sr content was increased a lower leakage current density and a smaller grain size were obtained. Also the mechanical properties such as hardness, Young's modulus and contact stress-strain were also studied by nanoindentation. (c) 2006 Elsevier B.V. All rights reserved. |
| URI: | http://dx.doi.org/10.1016/j.mseb.2006.03.025 http://hdl.handle.net/11536/12028 |
| ISSN: | 0921-5107 |
| DOI: | 10.1016/j.mseb.2006.03.025 |
| 期刊: | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY |
| Volume: | 131 |
| Issue: | 1-3 |
| 起始頁: | 281 |
| 結束頁: | 284 |
| 顯示於類別: | 期刊論文 |

