標題: Nanomechanical characteristics of BaxSr1-xTiO3 thin films
作者: Jian, Sheng-Rui
Chang, Win-Jin
Fang, Te-Hua
Ji, Liang-Wen
Hsiao, Yu-Jen
Chang, Yee-Shin
電子物理學系
Department of Electrophysics
關鍵字: BST;XRD;AFM
公開日期: 15-Jul-2006
摘要: The nanomechanical properties of barium strontium titanate (BaxSr1-xTiO3, x=0-1) deposited on a silicon substrate were investigated using the metalorganic deposition method. The characteristics of the BaxSr1-xTiO3 thin film's crystalline structure and surface roughness were achieved by means of X-ray diffraction (XRD) and atomic force microscopy (AFM). The results indicated that as the Ba content was decreased and therefore the Sr content was increased a lower leakage current density and a smaller grain size were obtained. Also the mechanical properties such as hardness, Young's modulus and contact stress-strain were also studied by nanoindentation. (c) 2006 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.mseb.2006.03.025
http://hdl.handle.net/11536/12028
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2006.03.025
期刊: MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
Volume: 131
Issue: 1-3
起始頁: 281
結束頁: 284
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