標題: | Nanomechanical characteristics of BaxSr1-xTiO3 thin films |
作者: | Jian, Sheng-Rui Chang, Win-Jin Fang, Te-Hua Ji, Liang-Wen Hsiao, Yu-Jen Chang, Yee-Shin 電子物理學系 Department of Electrophysics |
關鍵字: | BST;XRD;AFM |
公開日期: | 15-Jul-2006 |
摘要: | The nanomechanical properties of barium strontium titanate (BaxSr1-xTiO3, x=0-1) deposited on a silicon substrate were investigated using the metalorganic deposition method. The characteristics of the BaxSr1-xTiO3 thin film's crystalline structure and surface roughness were achieved by means of X-ray diffraction (XRD) and atomic force microscopy (AFM). The results indicated that as the Ba content was decreased and therefore the Sr content was increased a lower leakage current density and a smaller grain size were obtained. Also the mechanical properties such as hardness, Young's modulus and contact stress-strain were also studied by nanoindentation. (c) 2006 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.mseb.2006.03.025 http://hdl.handle.net/11536/12028 |
ISSN: | 0921-5107 |
DOI: | 10.1016/j.mseb.2006.03.025 |
期刊: | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY |
Volume: | 131 |
Issue: | 1-3 |
起始頁: | 281 |
結束頁: | 284 |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.