Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry

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DC Field	Value	Language
dc.contributor.author	Chao, YF	en_US
dc.contributor.author	Lee, KY	en_US
dc.contributor.author	Lin, YD	en_US
dc.date.accessioned	2014-12-08T15:16:25Z	-
dc.date.available	2014-12-08T15:16:25Z	-
dc.date.issued	2006-06-10	en_US
dc.identifier.issn	0003-6935	en_US
dc.identifier.uri	http://dx.doi.org/10.1364/AO.45.003935	en_US
dc.identifier.uri	http://hdl.handle.net/11536/12158	-
dc.description.abstract	The analytical solutions of the azimuthal deviation of a polarizer and an analyzer were obtained by polarizer-sample-analyzer ellipsometry with a three-intensity measurement technique. By performing two sets of this three-intensity measurement with the polarizer's azimuth set at 45 degrees and at -45 degrees, we were able to obtain a set of ellipsometric parameters free from the azimuthal deviations of the polarizer and the analyzer. (c) 2006 Optical Society of America.	en_US
dc.language.iso	en_US	en_US
dc.title	Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1364/AO.45.003935	en_US
dc.identifier.journal	APPLIED OPTICS	en_US
dc.citation.volume	45	en_US
dc.citation.issue	17	en_US
dc.citation.spage	3935	en_US
dc.citation.epage	3939	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000238199700002	-
dc.citation.woscount	9	-
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