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dc.contributor.authorChang, MFen_US
dc.contributor.authorChiou, LYen_US
dc.contributor.authorWen, KAen_US
dc.date.accessioned2014-12-08T15:16:32Z-
dc.date.available2014-12-08T15:16:32Z-
dc.date.issued2006-06-01en_US
dc.identifier.issn1057-7130en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSII.2006.873640en_US
dc.identifier.urihttp://hdl.handle.net/11536/12223-
dc.description.abstractVarious code patterns of a via-programming read only memory (ROM) cause significant fluctuations in coupling noise between, bitlines (BLs). This crosstalk between BLs leads to read failure in high-speed via-programmable ROMs and limits the coverage of applicable code patterns. This work presents a content-aware design framework (CADF) for via-programming ROMs to overcome the crosstalk induced read failure. The CADF ROMs employ a content-aware structure and correspondent code-structure programming algorithm to reduce the amount of coupling noise source while maintaining nonminimal BL load for crosstalk reduction. A 256-Kb conventional ROM and a 256-Kb CADF ROM were fabricated using a 0.25-mu m logic CMOS process. The measured results ascertain that the read induced read failure is suppressed significantly by CADF. The CADF ROM also reduced 86.2% and 94.5% in power consumption and standby current compared to the conventional ROM, respectively.en_US
dc.language.isoen_USen_US
dc.subjectcode patternsen_US
dc.subjectcrosstalken_US
dc.subjectread only memory (ROM)en_US
dc.titleCrosstalk-insensitive via-programming ROMs using content-aware design frameworken_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCSII.2006.873640en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFSen_US
dc.citation.volume53en_US
dc.citation.issue6en_US
dc.citation.spage443en_US
dc.citation.epage447en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000238707000004-
dc.citation.woscount4-
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